Quantitative dynamic force microscopy with inclined tip oscillation

• Philipp Rahe,
• Daniel Heile,
• Reinhard Olbrich and
• Michael Reichling

Beilstein J. Nanotechnol. 2022, 13, 610–619, doi:10.3762/bjnano.13.53

• as force mapping. To measure the tip–surface force in a dynamic measurement, the force probe acts as a high-Q oscillator and elastically responds to by static and dynamic displacement described by with being the unit vector along the tip sampling path. This path is usually straight and assumed to

• excited to periodic displacement q(t) = q(t + 1/fexc) along the q-axis at an excitation frequency fexc. To bring the tip in the desired range of interaction with the surface and to perform the movements required for imaging, force mapping, and taking force curves, the sensor is moved by coarse and fine

Alteration of nanomechanical properties of pancreatic cancer cells through anticancer drug treatment revealed by atomic force microscopy

• Xiaoteng Liang,
• Shuai Liu,
• Xiuchao Wang,
• Dan Xia and
• Qiang Li

Beilstein J. Nanotechnol. 2021, 12, 1372–1379, doi:10.3762/bjnano.12.101

• characterized by AFM is shown in Figure 1. For the mechanical mapping, the AFM cantilever needs to be calibrated first. During the scanning process, the applied force should be less than 3 nN to prevent cell destruction. For force mapping, 400 force curves were collected for each selected area and at least 30

Correction: Extracting viscoelastic material parameters using an atomic force microscope and static force spectroscopy

• Cameron H. Parvini,
• M. A. S. R. Saadi and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2021, 12, 137–138, doi:10.3762/bjnano.12.10

• microscopy (AFM); creep; force mapping; indentation; Kelvin–Voigt; static force spectroscopy (SFS); viscoelasticity; In the “Useful Viscoelastic Quantities” section of the original publication, it is stated that the storage modulus (E′) and storage compliance (J′) are inverses of one another (Equation 10

Extracting viscoelastic material parameters using an atomic force microscope and static force spectroscopy

• Cameron H. Parvini,
• M. A. S. R. Saadi and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2020, 11, 922–937, doi:10.3762/bjnano.11.77

• microscopy (AFM); creep; force mapping; indentation; Kelvin–Voigt; static force spectroscopy (SFS); viscoelasticity; Introduction Modern AFM applications commonly involve testing samples that are soft, biological, or polymeric in nature. Understanding the dissipative nature of these materials at the

• specimen disk using double-sided carbon tape. The force mapping (six scan lines, six points per scan line) technique was implemented using an Asylum MFP-3D AFM to accommodate a variety of sample configurations, which yielded 36 indentation datasets at 36 different locations. Furthermore three approach

Direct AFM-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics

• Katherine Atamanuk,
• Justin Luria and
• Bryan D. Huey

Beilstein J. Nanotechnol. 2018, 9, 1802–1808, doi:10.3762/bjnano.9.171

• accelerate such measurements of thousands of discrete spectra, as implemented for “peak force” [16] or “fast force” mapping [17][18] where arrays of force–distance curves are acquired during continuous scanning. However, current detection is generally slower than force transduction due to LRC time constants

Nanoscale mapping of dielectric properties based on surface adhesion force measurements

• Ying Wang,
• Yue Shen,
• Xingya Wang,
• Zhiwei Shen,
• Bin Li,
• Jun Hu and
• Yi Zhang

Beilstein J. Nanotechnol. 2018, 9, 900–906, doi:10.3762/bjnano.9.84

• , Fadh, will increase due to sample polarization (Figure 1b), which is positively correlated to its dielectric constant. Therefore, adhesion force mapping under a biased AFM tip can be expected to characterize the local dielectric property distribution. An example of adhesion force mapping with a biased

• properties under ambient conditions. In addition, adhesion force mapping with a biased AFM tip can be used to distinguish between different dielectric materials at the nanoscale. In order to prove this, a mixed sample of GO and CRGO sheets was studied as a model system (Figure 3). CRGO is a product of GO

• electrostatic interaction region, but the adhesion mapping in PF-QNM mode works on the sample surface all the time, no matter if the AFM tip is biased or not. This result proves that adhesion force mapping under a biased AFM tip has the same capacity as SPFM to distinguish local dielectric distribution, but has

Noise in NC-AFM measurements with significant tip–sample interaction

• Jannis Lübbe,
• Matthias Temmen,
• Philipp Rahe and
• Michael Reichling

Beilstein J. Nanotechnol. 2016, 7, 1885–1904, doi:10.3762/bjnano.7.181

• case of negligible tip–sample interaction. Noise with significant tip–sample interaction Realistic NC-AFM imaging or force mapping experiments are performed at a small tip–sample distance, or even in the repulsive regime [22], where large gradients of the tip–sample force generate strong gradients in

Modelling of ‘sub-atomic’ contrast resulting from back-bonding on Si(111)-7×7

• Adam Sweetman,
• Samuel P. Jarvis and
• Mohammad A. Rashid

Beilstein J. Nanotechnol. 2016, 7, 937–945, doi:10.3762/bjnano.7.85

• force mapping of atomic and molecular structures using non-contact atomic force microscopy (NC-AFM). In particular, suppressing the chemical bonding between tip and sample enables the stable exploration of the repulsive part of the tip–sample force regime, which has allowed outstanding resolution to be

3D nano-structures for laser nano-manipulation

• Gediminas Seniutinas,
• Lorenzo Rosa,
• Gediminas Gervinskas,
• Etienne Brasselet and
• Saulius Juodkazis

Beilstein J. Nanotechnol. 2013, 4, 534–541, doi:10.3762/bjnano.4.62

• distribution and force mapping (discussed below) because there is no strong pushing (scattering force), which exists at the extraordinary transmission maxima. Also, these are the wavelengths for the planned future laser trapping experiments. The transmission of the nano-well arrays was experimentally

• are repelled from high intensity regions, while dielectric nano-particles will be attracted. Force mapping The force mapping was calculated by using the Lorentz force formalism (from section “Background: Lorentz force”) on a polystyrene-bead probe (n = 1.504) of diameter d with the 3D-FDTD method. In

Towards 4-dimensional atomic force spectroscopy using the spectral inversion method

• Jeffrey C. Williams and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2013, 4, 87–93, doi:10.3762/bjnano.4.10

• compliance, which are observed in the response of real viscoelastic surfaces. Figure 3a provides a schematic of our application of the 4D force mapping concept, modeling the surface as a simple SLS that also experiences van der Waals interactions with the tip. Figure 3b illustrates a “virtual experiment” in

Growth behaviour and mechanical properties of PLL/HA multilayer films studied by AFM

• Cagri Üzüm,
• Johannes Hellwig,
• Narayanan Madaboosi,
• Dmitry Volodkin and
• Regine von Klitzing

Beilstein J. Nanotechnol. 2012, 3, 778–788, doi:10.3762/bjnano.3.87

• prerequisite image as well as the sample thickness in force-mapping studies [13][14][21][22][26][27]. The disadvantages mainly lie in the difficulty of obtaining a detailed image on soft surfaces, especially in liquid media. A magnetically driven cantilever as used in this study enhances the image quality

Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction

• Mehmet Z. Baykara,
• Omur E. Dagdeviren,
• Todd C. Schwendemann,
• Harry Mönig,
• Eric I. Altman and
• Udo D. Schwarz

Beilstein J. Nanotechnol. 2012, 3, 637–650, doi:10.3762/bjnano.3.73

• near the hollow site with decreasing tip–sample distance, as illustrated in Figure 6. Considering that most tips employed in NC-AFM measurements are asymmetric, 3-D force-mapping experiments performed on such samples may be instructive only for large enough tip–sample distances. If smaller distances

Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy

• Joachim Welker,
• Esther Illek and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2012, 3, 238–248, doi:10.3762/bjnano.3.27

• high-resolution, dynamic AFM modes. Examples are the measurement of the force needed to move an atom on surface [2] or the chemical identification of different adatom species [3]. Another trend is the three-dimensional force mapping [4][5] giving tomographic insight into the force field over atoms and